HP 4275A MANUAL PDF

This manual may contain references to HP or Hewlett-Packard. Please note that Hewlett-. Packard’s former test and measurement, semiconductor products and. A. • Test frequencies – 10 kHz to 10 MHz. • Test signal level – 1 mV to 1 V rms. • % basic AUTO MANUAL DOWN UP. SELF. TEST The A operates over a frequency range of Hz to kHz ually or under HP-IB control. The HP A and HP A Multi-frequency LCR Meters, microprocessor- based impedance . Trigger: internal, external or manual. Measurement terminals.

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Search the history of over billion web pages on the Internet. Full text of ” HP: Safety Considerations Instruments Covered by Manual Option Special Frequency Options Other Options Accessories Supplied Initial Inspection Preparation for Use Line Voltage and Fuse Selection Power Cable Installation Instructions Installation of Optionsand Storage and Shipment EnvironmentPackaging 2- Panel Features Self Test Basic Operating Check.

Measurement Function Test Signals Measurement Ranges Circuit Mode Initial Display and Indications Mamual of Test Cable Length Measured Values and Behavior of Components. External DC Bias External Triggering Option AnnunciationOption Special Test Frequency OptionOption HP-IB Compatibility Data Output Display A and Display B Data 3 – Recall Reference Data 3 – Test Signal Level Monitor Data 3 – Service Request Status Byte 3 – General Information Accessories Available Available Measurement Functions Measurement Parameter Formulas Test Signal Level Check Ranges Dissipation Factor Equations Mahual Signal Level Monitor Accuracy Typical Characteristics of Test Fixtures and Leads Annunciation Display Meanings Remote Program Codes Model A and Accessories.

Serial Number Plate 1- 3. Dimensions of Test Fixture Contacts 2- 1. Power Cables Supplied Rack Mount Kits 2- 4.

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Option Installation 3- 0. Self Test Procedure Parallel and Series Parametor Relationships.

Four Terminal Pair Measurement Principle Test Signal Phase on Test Cables Residuals Present in Measuring Circuit Effect of Resonance In Sample Typical Impedance Locus of an Inductor Measurement Accuracies General Component Measurements Variable Test Parameter Measurement Semiconductor Device Measurement External DC Bias Circuits. Helpful Instructions Option Annunciation Meanings DC Bias Connector Sample Program 1 with the A Sample Program 2 with the A Make all appropriate serial number related changes indicated in the tables below.

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Add the following note: NOTE Manual change supplements are revised as often as necessary to keep manuals as current and accurate as possible. Hewlett-Packard recommends that you periodically request the latest edition of this supplement. Free copies are available from all HP offices. When requesting copies quote the manual identification information from your supplement, or the model number and print date from the title page of the manual.

Index of /~kurt/manuals/manuals/HP Agilent

These units are already equipped with an Option compatible A9U Pagemanuall Selection of Test Cable Length: Change the last note on the page to read: To minimize incremental measurements errors at frequencies above 4MHz when the UNKNOWN terminals are extended using 1 meter cables, the four-terminal-pair must be converted into a three-terminal configuration at the cable ends by shorting the Low side cables and the High side cables with low impedance straps as illustrated below.

The error causing residuals, Lo and Co, are shown in the figure.

This method, however, cannot be used for inductance measurements on DUTs of from nH to 3yH when the test frequency is a special option frequency from 4MHz to Pageparagraph Phenomenon -2, Output measurement data from the A may include two or more spaces in the first part of each string, though each data string should have only one space.

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Refer to paragraph on page for data output format. Described below are software solutions for the above phenomena. For Phenomenon -1 – 1: There is no software solution. For Phenomenon -1 – 2: However, the first measurement data of sequential measurement data is invalid.

PageTableCalibration Accuracy Tests: To apply this manual to these instruments, make the following changes: Perform mwnual test for al 1 instruments. The German Bundespost has been notified that this equipment was put into circulation and was granted the right to check the product type for 4275q with these requirements.

This new component measuring instrument, developed by Hewlett-Packard, satisfies the wider measuring requirements for accuracy, speed, flexibility and versatility.

Additionally, a new level of ease of operation is brought to the electronics industry. This operability both helps to up-grade the quali- ty of product design and speeds physical and chem- ical research of material investigations creating a new measurement capability in these and other scientific fields.

The A Multi -frequency LCR Meter is the instrument which embodies these ideas and which provides these measurement advan- tages. These units cover the lower and higher frequency re- gions, respectively — and both reflect the new concepts.

The Model A, in particular, is an advanced LCR meter which makes high frequency component measurements simple and much easier.

Both instruments make the best of microprocessor advantages to achieve fully automated measurements and ease of operation.